Joseph Federico NJ

Joseph Federico NJ is the Vice President and Director of Operations at NJ Micro Electronic Testing, Inc. He developed the Mission: Imposter testing system which has helped in the development of most counterfeit detection requirements in the electronics industry today.

New Jersey, US

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Department of Defense, U.S. Army ARDEC, Picatinny Arsenal, NJ

Mil Std 2000 Soldering Technology, Soldering Technology

1994 – 1994 

Fairleigh Dickinson University

Bachelor’s of Science Degree, Electronics Engineering

1982 – 1986

Columbia University in the City of New York

Executive Education, Graduate School of Business

2015 – Present 

Work Experience

VP & Director Of Operations

NJMET, Inc (NJ Micro Electronic Testing)

September 1978 – Present

Directs NJMET's business operations, including engineering, marketing, management, administration, quality, and production. Areas of responsibility include overseeing Test Engineers, Sales and Marketing (direct customer contact, defining NJMET's strategic marketing plans), Engineering Management (overseeing all aspects of the testing, tooling, and other engineering activities), and Human Resources (developing personnel rules and regulations and ensuring compliance with regulatory statutes and plans).

Test Operator

Solid State Testing

August 1977 – August 1978

Burlington, Mass 


Counterfeit Components Avoidance Workshop, Components Technology Institute, Salem NH Sept. 2012

IDEA Counterfeit Components Training Program, Clifton, NJ August 2012 

Introduction to AS5553 and Counterfeit Electronic Parts Avoidance Training, SAE International Sept. 2010 (IACET Provider No: 3713)

Manufacturing Process Control, Honeywell Engines and Systems April 2005

Six Sigma Plus Green Belt Training, Honeywell Engines and Systems April 2003 

Solderability Requirements of J-STD-001, J-STD-002 & J-STD-003, STI Electronics, Madison Al, Oct. 2014

Honors & Awards

U.S. Tech Magazine Article Appreciation 2015

U.S. Tech Magazine, Phoenixville, PA

December 2015

Article Appreciation for "Issues in Solvent Testing for Counterfeits" Published December 2015 

U.S. Tech Magazine Article Appreciation 2014

U.S. Tech Magazine, Phoenixville, PA

October 2014

Article Appreciation for "Issues in Solvent Testing for Counterfeits" Published October 2014 

The Italian Heritage Award

The Italian Tribune presented by Buddy Fortunato Publisher

October 2012

U.S. Tech Magazine Article Appreciation 2012

U.S. Tech Magazine, Phoenixville, PA

August 2012

Article Appreciation for "Electrical Testing to Detect Counterfeit Components" Published August 29, 2012 

U.S. Tech Magazine Article Appreciation 2009

U.S. Tech Magazine, Phoenixville, PA

October 2009

Recognition for Authored Article, Stopping Counterfeit Parts Before They Do Damage Published October 2009 

Champions for Children at St. Joseph's

St. Joseph Children Hospital, Paterson, NJ

December 2008

The "Heartbeat of America Award" Award

Rear Admiral Kevin F. Delaney ( Ret. )

June 2007

Rear Admiral Kevin F. Delaney ( Ret. ) presented Joseph & Giacomo Federico of NJMET Inc with the The "Heartbeat of America Award" Award during NJMET's Special TV Segment Hosted by William Shatner on June 28, 2007

Odem (Diamond) Counterfeit Awareness Recognition, Herzliya Isreal

Odem Technologies, Rishon Lezion, Israel

April 2007

The First Electronic Components Awareness Program Presented in Israel 

IDEA Special Publication Acknowledgement IDEA-STD-1010A

The Independant Distributors of Electronics Association

November 2006

IDEA Special Acknowledgement to contribution efforts to the IDEA-STD-1010A Publication


Issues in Authenticating Military Marked Components - CMSE Conference 2016

March 2016 – March 2016

Presentation on methods to authenticate electronic components intended for military applications. The presentation includes information on testing components, traceability and documentation.


MISSION IMPOSTER Counterfeit Detection

United States Reg No: 3,600,760 Ser No. 76-691,552

Issued November 2007

Consulting Services Provided in Connection with Providing Laboratory Tests for Counterfeit Detection, Namely, Consultation in the Field of Product Authentication and Tracking, To Protect Against Counterfeiting and Tampering, To Ensure the Integrity of Electronic Components, in Class 45(U.S. CLS, 100 and 101)


In Memoriam: Jim Raby

Evaluation Engineering - November 22, 2017

Tribute to Mr. Jim Raby recounting his career from NASA and the US Navy to his founding of Soldering Technology International Inc. 

Solderability and Tinning, Does the Industry Really Know the Difference

Tech Time Electronics and Technology News - January 10, 2016

Tinning is the process of dipping electronic component terminations into a bath of molten solder alloy, creating a fresh inter metallic layer between the solder and the base metal and providing a highly solderable surface finish. Solderability testing is designed to determine how well molten solder will flow, or “wet”, on the solderable surfaces. This article explains the differences between the two and when each of the tests should be used.

Solderability and Tinning: Does the Industry Know the Difference?

U.S. Tech - December 8, 2015

The purpose and use of solderability vs. tinning services often causes confusion, even within the electronic component testing industry. This article explains the difference and when each process is appropriate.  

Detecting counterfeit-marked components.

EE Times Europe - December 14, 2014 

The sophistication of some counterfeit components requires the use multiple test methods to differentiate the counterfeit from the authentic. Different components require different testings and procedures. Use of the wrong testing procedures for the type of component can result in false positives, incorrectly identifying authentic parts as counterfeit.

Issues in Solvent Testing for Counterfeits

U.S. Tech - October 21, 2014

Improper counterfeit component testing procedures can yield incorrect or misleading results. This article describes the correct solvent testing procedures for different types of electronic components. 

Electrical testing to detect counterfeit components

Test & Measurement World - August 28, 2012

Counterfeit electronic components are an increasing threat to the supply chain, but there is no single test that can detect all counterfeit parts. This article outlines why it is necessary to create a customized test plan—including a full suite of electrical testing—for each component based on its intended use. 

Testing to Detect Counterfeit Components

U.S. Tech - May 15, 2012

The quality and sophistication of counterfeit electronic components has increased to the point that these fake parts can pass initial inspection protocols. This article explains how NJMET's counterfeit component test program uses a multilevel inspection process to weed out counterfeit components. 

Television Appearance on Counterfeit Detection Fox Business & CNBC

20th Century Business Hosted by Jackie Bales - October 20, 2010

Joseph Federico and Giacomo Federico appear on 21st Century Business aired on Fox Business and CNBC to discuss current developments in Electronic Component Counterfeit Detection

Stopping Counterfeit Parts Before They Do Damage,

US Tech - October 1, 2009

Thanks to a groundbreaking program created at NJ Micro Electronic Testing, Inc. (NJMET), the imitation electronic devices that began infiltrating the industry close to a decade ago can now be detected and stopped. It's important that this happens before they are used in the manufacture of products that could put many projects and hundreds of thousands of lives in danger. The multi-faceted process used to identify counterfeits is described.

Television Appearance on Counterfeit Detection

Heartbeat of America Hosted by William Shatner -  September 1, 2007

Joseph Federico was invited to discuss NJMET's Counterfiet Detection Program on the Heartbeat of America show in 2007. Joseph Federico and his father Giacomo were also presented with the “Keeping America Strong” award hosted on TV's Heartbeat of America show hosted by William Shatner.

Accelerated Life Tests Yield Failure Data Fast

Test and Measurement World - May 1, 2004

In recent years, much useful methodology has been developed to predict the life of electronic microcircuits using environmental accelerated steady state life testing. Such testing has been of particular importance in the to the plastic microcircuit arena, which has become increasingly important because of the reform mandated by Secretary of Defense William Perry in 1994 under the Blue Print for Change objective. Such acceleration testing experiments can be vital in predicting the operational future and functional performance of either hermetically sealed or plastic encapsulated microcircuits. 

Accelerated Testing on Electronic Microcircuits

Aerospace Testing - May 1, 2003

Life testing of electronic microcircuits at higher stress levels than design conditions can yield results more quickly saving time and money. Data obtained from accelerated life testing, when properly modelled and analysed yields valuable information on product life and performance under normal use.

Environmental Testing of Plastic Encapsulated Microcircuits

Evaluation Engineering - May 1, 2000

Cutbacks instituted by the Department of Defense diminished military and aerospace manufacturing of hermetically sealed microcircuits (HSMs). As a result, these industries have reconsidered the use of commercial plastic encapsulated microcircuits (PEMs). This article discusses the reliability tests that are essential for determining if PEMs can be safely used in harsh environments.


ASTM International

Starting January 2016

GIDEP Government Industry Data Exchange Program

Starting September 2010

IEEE Aerospace

Starting January 2010

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