Main product : Optical metrology tool for wafer layer measurement.
Customer : TSMC FAB 7 R&D, TSMC FAB Info, Chipbond, ITRI
. Application support for wafer layer thickness measurement, tool HW and SW maintenance, upgrade, trouble shooting.
. Study of wafer sample for customer new project and established tool recipes for specific layers thickness.
. Coordinated resources to support customer requirements, problem solving and upgrade solution implementation.