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We welcome the contribution from our colleagues at NASA Johnson Space Centre, Florida and several other Universities and Research Organizations. We have been associated with this book from the very beginning. So this book comes from our own experiences and observations. We have chosen a broad based management of metrology including the basics, We are glad to see that the book includes a good deal of information on numerical metrology, for example, Mathematical Models and Numerical Methods, some of which have not appeared in previous metrology books. The book also includes some very interesting case histories. The book is divided into 6 chapters. Chapter 2, History and Types of Gauges • Introduction • The term "Gauge" • Definition of Gauges • Historical Background • The Evolution of Instrumentation Technology • The Development of Numerical Methods • Type of Instrumentation • History of the Atomic Microscope • Biological Metrology • Atomic Techniques • Numerical Metrology • Laboratory Based Techniques • Frequency Metrology • Optical Metrology • Interference Metrology • Manufacturing Metrology • Technology and Metrology • Theoretical Foundations Chapter 3, Introduction to the Micrometer • Definitions • History • Accuracy and Precision • Micrometer • Micrometer Modules • Gauge Block • Absolute and Relative • Calibration • Uncertainty of Measurements • Repeatability • Linearity • Statistical Methods Chapter 4, Range and Linearity of Micrometers • Mechanisms of movement • Accuracy • Range • Drift • Dimensioning Chapter 5, Slip Gages • Test Systems • Precision • Measurement • Applications Chapter 6, Classification of Metrology • Basic Metrology • Intermediate Metrology • Advanced Metrology
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