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4-6 years
6-10 years
10-15 years
More than 15 years
Taichung City, Taiwan
Avatar of 徐紹舜.
Avatar of 徐紹舜.
Past
業務襄理(期權量化交易員) @元富證券股份有限公司
2019 ~ 2022
研發工程師
Within one month
simple app using JAVA syntax and designed layouts. C++(Arduino) : Designed hardware control applications using circuit boards. R : Studied data processing and statistical applications at NTU HWRD, Wistron CorporationActively researching wireless charging theories and biovision models. Computer circuit design, system functionality verification, and debugging Photo Lithography P.E., TSMCConducting analysis to ensure the improvement of wafer yield. Optimizing parameters in order to enhance the yield rate. Maintaining close communication with both R&D teams and production lines Skills VBA(build up 5-D TXO price DB, design backtest system)、 python(design
Excel
VBA
Self Learning
Unemployed
Full-time / Interested in working remotely
4-6 years
國立台灣大學
光電工程學研究所
Avatar of Yu-Ta,Wu.
Offline
Avatar of Yu-Ta,Wu.
Offline
Metrology Engineer (OCD) @Taiwan Semiconductor Manufacturing Company(TSMC)
2018 ~ Present
Metrology Engineer
More than one year
analysis , Sense-array .etc) •N7 wafer container quality owner (Foup dimension/Inspection/AMC Gas analyzer) Mask & Metrology Engineering • Taiwan Semiconductor Manufacturing Company(TSMC) 十一月九月 2018 •N28 Critical Dimension Electron Microscope (CD-SEM) metrology sponsor. •LIT defect scanner (Viper/OM) sponsor for lithography-related defect monitor. •Thermal-wave (OP) sponsor for lithography photo-resist thickness defense. •2nd version Mask qualified by handling experiment lot pi-run CD/KLA scan & WAT analysis . 學歷National Chiao Tung University Master's degree in Display InstituteNational Chiao Tung University Bachelor's
Optical measurement
cdsem
Metrology
Full-time / Interested in working remotely
6-10 years
National Chiao Tung University
Display Institute
Avatar of the user.
Avatar of the user.
EUV Equipment Engineer @台灣積體電路製造股份有限公司
2017 ~ Present
Mechanical / Thermal Engineer, Semiconductor Engineer
Within one year
Auto CAD
COMSOL
CAD/CAM
Full-time
4-6 years
National Chiao Tung University
Master of Mechanical engineering

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Technical Skills
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Problem-Solving
Ability to identify, analyze, and prepare solutions to problems.
Adaptability
Ability to navigate unexpected situations; and keep up with shifting priorities, projects, clients, and technology.
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Teamwork
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Leadership
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More than one year
Metrology Engineer
Logo of Taiwan Semiconductor Manufacturing Company(TSMC).
Taiwan Semiconductor Manufacturing Company(TSMC)
2018 ~ Present
Taichung, 台灣
Professional Background
Current status
Job Search Progress
Professions
Semiconductor Engineering
Fields of Employment
Semiconductor
Work experience
6-10 years
Management
None
Skills
Optical measurement
cdsem
Metrology
Semiconductor Process
TFT LCD Array Thin Film Process
Languages
English
Intermediate
Chinese
Native or Bilingual
Job search preferences
Positions
Metrology Engineer
Job types
Full-time
Locations
Remote
Interested in working remotely
Freelance
No
Educations
School
National Chiao Tung University
Major
Display Institute
Print

Yu-Ta,Wu


6+ years experienced metrology engineer of process technologies at Taiwan Semiconductor Manufacturing Company (N06/N07/N22/N28).
3+ years in 6nm/7nm process, found path for optical metrology & quality control.
3+ years in 22nm/28nm litho-related metrology & 2nd mask quality sponsor.
Personality, well communicating with cross-department/learning fast/work smart/willing to accept new challenges.
Extremely interested in companies located in Taichung/Taipei/Taoyuan or the USA.

  Taichung City, Taiwan   

工作經歷

Metrology Engineer (OCD)  •  Taiwan Semiconductor Manufacturing Company(TSMC)

九月 2018 - Present

•N6/N7 Optical Critical Dimension (OCD) metrology owner (Recipe/Quality Control/Productivity.etc)
•OCD 2D/3D library model building for inline new monitor create & path-finding.
•Co-work with PID/Module for OCD inline issue & metrology solution.
•Developed metrology methodology (ex:Machine learning for spectrum analysis , Sense-array .etc)
•N7 wafer container quality owner (Foup dimension/Inspection/AMC Gas analyzer)

Mask & Metrology Engineering  •  Taiwan Semiconductor Manufacturing Company(TSMC)

十一月 2015 - 九月 2018

•N28 Critical Dimension Electron Microscope (CD-SEM) metrology sponsor.
•LIT defect scanner (Viper/OM) sponsor for lithography-related defect monitor.
•Thermal-wave (OP) sponsor for lithography photo-resist thickness defense.
•2nd version Mask qualified by handling experiment lot pi-run CD/KLA scan & WAT analysis .

學歷

2012 - 2014

National Chiao Tung University

Master's degree in Display Institute

2008 - 2012

National Chiao Tung University

Bachelor's degree in Department of Photonics

技能


  • Optical measurement
  • cdsem
  • Metrology
  • Semiconductor Process
  • TFT LCD Array Thin Film Process

語言


  • English — 中階
  • Chinese — 母語或雙語
Resume
Profile

Yu-Ta,Wu


6+ years experienced metrology engineer of process technologies at Taiwan Semiconductor Manufacturing Company (N06/N07/N22/N28).
3+ years in 6nm/7nm process, found path for optical metrology & quality control.
3+ years in 22nm/28nm litho-related metrology & 2nd mask quality sponsor.
Personality, well communicating with cross-department/learning fast/work smart/willing to accept new challenges.
Extremely interested in companies located in Taichung/Taipei/Taoyuan or the USA.

  Taichung City, Taiwan   

工作經歷

Metrology Engineer (OCD)  •  Taiwan Semiconductor Manufacturing Company(TSMC)

九月 2018 - Present

•N6/N7 Optical Critical Dimension (OCD) metrology owner (Recipe/Quality Control/Productivity.etc)
•OCD 2D/3D library model building for inline new monitor create & path-finding.
•Co-work with PID/Module for OCD inline issue & metrology solution.
•Developed metrology methodology (ex:Machine learning for spectrum analysis , Sense-array .etc)
•N7 wafer container quality owner (Foup dimension/Inspection/AMC Gas analyzer)

Mask & Metrology Engineering  •  Taiwan Semiconductor Manufacturing Company(TSMC)

十一月 2015 - 九月 2018

•N28 Critical Dimension Electron Microscope (CD-SEM) metrology sponsor.
•LIT defect scanner (Viper/OM) sponsor for lithography-related defect monitor.
•Thermal-wave (OP) sponsor for lithography photo-resist thickness defense.
•2nd version Mask qualified by handling experiment lot pi-run CD/KLA scan & WAT analysis .

學歷

2012 - 2014

National Chiao Tung University

Master's degree in Display Institute

2008 - 2012

National Chiao Tung University

Bachelor's degree in Department of Photonics

技能


  • Optical measurement
  • cdsem
  • Metrology
  • Semiconductor Process
  • TFT LCD Array Thin Film Process

語言


  • English — 中階
  • Chinese — 母語或雙語