1. FW pretest design During the Micron project, I finished the pre-test process as below items: 1-1) Training delay time level, driving, ODT. 1-2) Test SRAM 1-3) Scan orginal/erase/program bad block 1-4) Build different block. 1-5) Program FW Block. 2. Manufacturing test. Use unique method to adjust NAND parameters in mass production stage. 2-1) Erase/Program/Read endurance cycle test to provide GC Strategy. 2-2) Generate VT distribution to analyze NAND Flash status. 2-3) Adjust Program judgment level to fix retention issue. 3. Design verification GUI platform by Python and PYQT. Implemet a fast test script design on a platform for our internel verification team.

1. NAND Flash Characteristic Analysis GUI Platform 1-1) Endurance 1-2) Retention 1-3) Vt Distribution 1-4) Vt bitmap(Cell by cell trace) 1-5) Block Life prediction Collection BiCS3 Whole die life cycle data analysis 1-6) Judgment level analysis Detect distribution window location(gray code) 2. Familiar with NAND 2-1) Micron : B0KB, L06B, B16A, B27A, N18A 2-2) Intel : N18A 2-3) Toshiba: BiCS3 2-4) Sandisk: BiCS3 2-5) YMTC : 3DMLC

1.Udisk MP 1-1) Write FW code to NAND Flash 1-2) Load code flow 1-3) udisk format 2.Udisk MP module 2-1) Scan BBT module 2-2) Build bad column table 2-3) Build different block table 3.Udisk FTL Debug tool 3-1) Mapping table trace function 3-2) Bad Block Table 3-3) RDMP function 3-4) ECC analysis 4.Udisk SDK 5.FT tool verification controller function 5-1) SDRAM RW 5-2) cmd queue test 5-3) BCH verification

1.Android AP design 2.Embedded system software 3.cowork with other OS engineers hardware engineers and application engineers.