Role Description

In this role you will develop and deploy productization solutions while partnering with cross functional teams to enable high volume manufacturing at fabrication plants and assembly and test sites. You will help integrate SoC technologies into devices and facilitate ATE manufacturing testing of SoC to validate performance and screen out failing devices. You will work closely with cross functional teams to ensure optimal test coverage and cost efficiencies in production to ensure high quality SoCs. A strong foundational knowledge of wafer processing, ATE/bench testing, reliability stress, qualification & failure analysis is expected. You will work with various groups to develop digital and mixed signal tests, automation methodologies ,develop/support internal tools for data analysis, yield analysis, silicon debug, reliability qualification, manufacturing ramp and customer returns. You will also be a critical partner on releasing cost effective production test solutions into mass production.

Responsibilities

1. Ensure new products meet product development requirements with respect to product specification, quality and reliability benchmarks and manufacturability.

2. Define NPI and production test plans, DoEs for product performance study.

3. Analyze test and characterization data to benchmark performance specifications.

4. Drive failure analysis studies to root cause fail modes/mechanisms to improve yield and quality metrics.

5. Partnering with the ATE, Bench and SLT Test teams for test program definition, test hardware specification and vector generation guidelines.

6. New products DPPM correlation and performance correlation between system and ATE.

7. Support product sustaining activities for yield improvement, lot disposition, test time reduction and RMA management.

1. At least 10 years in the semiconductor industry

2. Experience with Yield & Fail Pareto Analysis using JMP (preferred), Exensio, Datapower or O+

3. IC qualification, data review, production release, System Level Testing, test time reduction and yield improvement