Jan 2019 - Present
1. Responsible for special process yield improvement for 10%.
2. Development auto function increases production yield by 12%.
3. Defect analysis and reduction.
4. Teamwork with vendors to do new function testing and data collection.
5. Using Fault Detection & Classification System do the troubleshooting.
6. Using Big data to maintain the wafer source quality.
7. Tool retrofit and software upgrade data validation and function testing.